Customer: North American sensor manufacturer

Application: consumer WL-CSP accelerometer

Challenge: high UPH, low Cost-of-test requirement for inertial consumer applications

Solution: turn-key delivery of high performance, infinite turning KRONOS wafer level test cell

  • KRONOS test handler for 6DOF inertial sensors with automation
  • Tester HW
  • Test Software integration
  • 32 site Probe Card with changeable contact head


Product family: 
KRONOS - Wafer level test handler for 6/9DOF sensors with real stimulus.